Jim Leland has over twenty years’ experience in radiometry, photometry, colorimetry, and related fields, and has authored numerous papers, patents, and industry standards.  He has served on the executive boards of the Council for Optical Radiation Measurements (CORM) and the US National Committee of the CIE.  He is an officer of ASTM E12 (Color and Appearance), chairing subcommittees E12.03 (Geometry), and E12.05 (Fluorescence).  He is a member of SPIE, IES, and ISCC.  He studied Physics and Philosophy at Princeton University, and holds an MS in Imaging Science from the Rochester Institute of Technology (RIT).